Characterization of Nanorod Structure Using Spectroscopic Ellipsometry
نویسندگان
چکیده
منابع مشابه
Characterization of Nanocrystals Using Spectroscopic Ellipsometry
First applications of ellipsometry to the measurement of polyand nanocrystalline thin films date back to many decades. The most significant step towards the ellipsometric investigation of composite thin films was the realization of the first spectroscopic ellipsometers in the ’70s [3, 4, 8], which allowed the measurement of the dielectric function, the imaginary part of which is directly relate...
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This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced tec...
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ژورنال
عنوان ژورنال: Optics and Photonics Journal
سال: 2016
ISSN: 2160-8881,2160-889X
DOI: 10.4236/opj.2016.64007